◆ 抽換式探針機制,換針方便:探針座抽換輕巧方便,取放不會損傷AFM模組
![](/images/ckfinder/images/SPMFea1.jpg)
◆ 順序性引導介面,操作簡單
![](/images/ckfinder/images/SPMFea2.jpg)
◆ 含光學顯微系統可找到下針位置:800X(光學放大倍率20倍)
紅框標示字母U、G各為1μm大小,可輕鬆找到字母,定位樣品。
![](/images/ckfinder/images/SPMFea3.jpg)
◆ 可選配MFM、C-AFM、EFM、PFM、SThM等功能
磁力顯微鏡MFM
Magnetic Force Microscopy(15 X 15μm) |
導電原子力顯微鏡CAFM
Conductive Atomic Force Microscopy(15 X 15μm) |
![](/images/ckfinder/images/SPMFea4.jpg) |
![](/images/ckfinder/images/20120529_18h34m03s_Aux1_1.png) |
靜電力顯微鏡EFM
Electric Force Microscopy(15 X 15μm) |
壓電力顯微鏡PFM
PiezoresponseForce Microscopy(2 X 2μm) |
![](/images/ckfinder/images/20120201_15h40m22s_Phase_L_gwy.png) |
![](/images/ckfinder/images/20120322_17h33m34s_PFM_gwy.png) |
掃描熱顯微鏡Scanning Thermal Microscopy
SThM(15 X 15μm) |
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![](/images/ckfinder/images/20100728_13h57m30s_Probe_Trace_Data (2).png) |
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